Test Research, Inc. (TRI), the leading test and inspection systems provider for the electronics manufacturing industry, announces that the TR7700E SIII HAPs AOI has conformed to the evaluation standards set by the required specifications for APC-MFB-Compatible AOI.
The certification validated that Test Research, Inc.’s TR7700E SIII HAPs AOI has completed the integration with Panasonic’s Advanced Process Control (APC) systems. TRI shares the same vision of Panasonic Smart Factory Solutions Co. Ltd. by providing high-quality assurance inspection to the SMT assembly Industry.
TR77000 SIII Series provides world-class PCB inspection speed to detect the most minuscule and hidden defects. Combined a Smart Software and robust hardware platform, TR7700 SIII Series offer stable solder and component defect inspection and with high inspection coverage and easy programming.
Discover how TRI’s PCBA test and inspection solutions work together with Industry 4.0 data management infrastructure to bring you maximum value in the production line and minimize production costs. TRI’s systems are designed to interoperate with other manufacturing equipment to minimize downtime, optimize production quality and reduce operator workload.