NEO Tech, a leading provider of manufacturing technology and supply chain solutions for brand name OEMs in the industrial, medical and mil/aero markets, announces that it has expanded its Design for Test (DFT) service offering to perform fully CAD-driven design for testability analysis, earlier in the design process. This expansion is the latest in NEO Tech’s strategy to propel its customers to the top of their fields by investing in innovative, advanced technology.
Combining NEO Tech’s deep test engineering experience with a new software-driven DFT tool, based on Aster’s Testway® platform, NEO Tech can assist its OEM customers to accelerate new products to market faster by conducting test engineering activities concurrently with design activities. Additionally, its test engineers now can check testability, plan test strategies, predict fault coverage, and assign test points during the schematic design stage, which result in the following customer advantages:
- Fewer test problems
- Fewer iterations through layout
- Lower cost test fixture
- Higher test quality
- Faster time-to-market
In one recent new customer project this tool was used to determine accessibility for in-circuit test (ICT) and led us to add additional test points that improved coverage, reduced the fixture cost and reduced test cycle time by 30%. NEO Tech’s expanded design for testability (DFT) toolset enables an early design testability analysis and provides early feedback on board access. The tool allows the early simulation of a combination of inspection and test techniques to reduce cycle times and/or eliminate redundancy. Specific inspection and test equipment modules provide a more accurate predictive model for testability.
For more information about NEO Tech’s design for testability analysis, visit the company’s Web site at www.NEOTech.com.